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Title:
TARGET MATERIAL SENSOR USING PHOTONIC CRYSTAL AND DETECTION METHOD FOR TARGET MATERIAL
Document Type and Number:
WIPO Patent Application WO/2005/090947
Kind Code:
A1
Abstract:
A target material sensor using a photonic crystal being high in sensitivity to a target material to be detected and capable of being downsized, and a detection method for a target material. The sensor comprises an electromagnetic wave generating source for supplying an electromagnetic wave, a photonic sensor element and a detector. The photonic sensor element comprises a sensor waveguide having a photonic crystal structure to introduce an electromagnetic wave, and a sensor resonator coupled electro-magnetically with the sensor waveguide to resonate an introduced electromagnetic wave at a specific wavelength, the characteristics of an electromagnetic wave emitted from the sensor resonator being changed when the sensor resonator is exposed to an atmosphere containing a target material. The detector recognizes the intensity change of an electromagnetic wave on receiving it emitted from the sensor resonator, and determines the concentration of a target material from this intensity change to output a concentration-indicating signal.

Inventors:
NODA SUSUMU (JP)
ASANO TAKASHI (JP)
TAKANO HITOMICHI (JP)
Application Number:
PCT/JP2005/005249
Publication Date:
September 29, 2005
Filing Date:
March 23, 2005
Export Citation:
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Assignee:
UNIV KYOTO (JP)
MATSUSHITA ELECTRIC WORKS LTD (JP)
NODA SUSUMU (JP)
ASANO TAKASHI (JP)
TAKANO HITOMICHI (JP)
International Classes:
G01N21/3504; G01N21/45; G01N21/35; G01N21/77; G02B6/122; (IPC1-7): G01N21/35; G01N21/45
Domestic Patent References:
WO2002050514A12002-06-27
Foreign References:
US20020191884A12002-12-19
US6532326B12003-03-11
US20020155592A12002-10-24
US20020118937A12002-08-29
JP2005099007A2005-04-14
US20030039446A12003-02-27
Other References:
See also references of EP 1729111A4
None
Attorney, Agent or Firm:
Nishikawa, Yoshikiyo (Umeda-Daiichiseimei Bldg. 5F 12-17, Umeda 1-chome, Kita-k, Osaka-shi Osaka, JP)
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