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Title:
TEMPERATURE MEASUREMENT APPARATUS AND METHOD IN LAMP
Document Type and Number:
WIPO Patent Application WO/2023/159910
Kind Code:
A1
Abstract:
A temperature measurement apparatus and method in LAMP, which apparatus and method belong to the technical field of temperature measurement apparatuses for microfluidic chips. The temperature measurement apparatus in LAMP comprises: a temperature measurement mechanism (1), a heat conduction pad (2), a heating layer (3) and a heat insulation layer (4), which are arranged in sequence, wherein the temperature measurement mechanism (1) enters a corresponding temperature measurement cavity to collect corresponding working cavity temperature data, i.e., the heating layer (3) adjusts, according to the corresponding working cavity temperature data, heat generated by a corresponding heating source; and the heat insulation layer (4) prevents the heating layer (3) from transferring heat downwards, such that the heat generated by each heating source in the heating layer (3) is transferred to a corresponding heating area by means of the heat conduction pad (2). The working cavity temperature data is fed back by means of the temperature measurement mechanism (1), so as to serve as a basis for the constant temperature of a microfluidic chip (5), such that the temperature during an LAMP process can be accurately measured, thereby ensuring the stability and high efficiency of LAMP.

Inventors:
QIAO HUI (CN)
KWAN KWOK LEUNG PATRICK (CN)
CHEN QIAOLING (CN)
Application Number:
PCT/CN2022/117450
Publication Date:
August 31, 2023
Filing Date:
September 07, 2022
Export Citation:
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Assignee:
CHANGZHOU TRENDI MEDICAL TECH CO LTD (CN)
International Classes:
G01K13/00; G01K7/18
Foreign References:
CN114235196A2022-03-25
CN107619781A2018-01-23
CN106140338A2016-11-23
CN107694650A2018-02-16
CN112138735A2020-12-29
CN215757374U2022-02-08
JP2007120399A2007-05-17
Attorney, Agent or Firm:
BEIJING CIPRUN INTELLECTUAL PROPERTY AGENCY CO., LTD. (CN)
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