TEMPERATURE MEASURING SYSTEM AND TEMPERATURE MEASURING DEVICE

WIPO Patent Application WO/2014/058062

A1

[Problem] To provide a temperature measuring system for, using thermocouples, accurately measuring the temperature of an object the temperature of which is to be measured. [Solution] A device (1) is provided with a temperature measuring system provided with: a measurement step for bringing high-temperature contacts (4) of two kinds of thermocouples (A, B) into contact with or close to an object the temperature of which is to be measured, electrically connecting other end connections (6, 7, 8, 9) to conductive members (11, 12, 13, 14) having substantially the same temperature, and measuring the electromotive forces (eA, eB) of the respective thermocouples (A, B); and a calculation step for calculating a high-temperature contact temperature (T) and an other end connection temperature (T0) which satisfy both relational expressions (1, 2): EA(T, 0)-EA(T0, 0) = eA (1) EB(T, 0)-EB(T0, 0) = eB (2) where EA(T, 0) is a reference thermoelectromotive force at the high-temperature contact temperature (T) of the thermocouple (A), EA(T0, 0) is a reference thermoelectromotive force at the other end connection temperature (T0) of the thermocouple (A), EB(T, 0) is a reference thermoelectromotive force at the high-temperature contact temperature (T) of the thermocouple (B), and EB(T0, 0) is a reference thermoelectromotive force at the other end connection temperature (T0) of the thermocouple (B).

WAKATSUKI MASAO (JP)
MATSUZAWA MASAHITO (JP)
YAMAGUCHI NAOAKI (JP)

PCT/JP2013/077806

April 17, 2014

October 11, 2013

Click for automatic bibliography generation  

KYOCERA CORP (JP)

G01K7/14; B01J3/06; B01J19/00; G01K7/02

WO2011040634A1

2011-04-07

JP2009105132A	2009-05-14
JP2009294157A	2009-12-17
JPH0523078U	1993-03-26

View/Download PDF      PDF Help

Previous Patent: LIGHT-DEGRADABLE MATERIAL, SUBSTRATE AND METHOD FOR PATTERNING SAME

Next Patent: ELECTRIC DIE CASTING MACHINE