Title:
TEST APPARATUS
Document Type and Number:
WIPO Patent Application WO/2005/026755
Kind Code:
A1
Abstract:
A test apparatus for testing electronic devices, comprising a plurality of test modules for supplying, to electronic devices, test patterns for testing the electronic devices; a reference clock generator part for generating reference clocks; a generator circuit for generating, based on the reference clocks, timing signals for activating the plurality of test modules; a plurality of timing supplying parts, provided in association with the respective test modules, for supplying the timing signals to the respective test modules; and a control part for controlling the phases of those timing signals such that the timings at which the test modules output the test patterns in response to the timing signals are approximately the same.
Inventors:
KANBAYASHI HIRONORI (JP)
YATSUKA KOICHI (JP)
YATSUKA KOICHI (JP)
Application Number:
PCT/JP2004/013232
Publication Date:
March 24, 2005
Filing Date:
September 10, 2004
Export Citation:
Assignee:
ADVANTEST CORP (JP)
KANBAYASHI HIRONORI (JP)
YATSUKA KOICHI (JP)
KANBAYASHI HIRONORI (JP)
YATSUKA KOICHI (JP)
International Classes:
G01R31/3183; G01R31/28; G01R31/319; (IPC1-7): G01R31/28
Foreign References:
| JPS61176871A | 1986-08-08 | |||
| JPH03216568A | 1991-09-24 | |||
| JPH11304888A | 1999-11-05 |
Other References:
See also references of EP 1666896A4
Attorney, Agent or Firm:
Ryuka, Akihiro (24-12 Shinjuku 1-chome, Shinjuku-k, Tokyo 22, JP)
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