Title:
TEST CARRIER, OK/NG DETERMINATION DEVICE, AND OK/NG DETERMINATION METHOD
Document Type and Number:
WIPO Patent Application WO/2013/176128
Kind Code:
A1
Abstract:
A test carrier (10) temporarily housing a die (90) and comprising: a first wiring pattern (42) electrically connecting an external terminal (44) for the test carrier (10) and through-silicon vias (TSVs) (92) provided in the die; and a second wiring pattern (81) electrically connecting the TSVs (92).
Inventors:
NAKAMURA KIYOTO (JP)
Application Number:
PCT/JP2013/064077
Publication Date:
November 28, 2013
Filing Date:
May 21, 2013
Export Citation:
Assignee:
ADVANTEST CORP (JP)
International Classes:
G01R31/26; H01R31/06; H01R33/76
Foreign References:
| JP2006145551A | 2006-06-08 | |||
| JP2000068335A | 2000-03-03 | |||
| JP2010156569A | 2010-07-15 |
Attorney, Agent or Firm:
TOKOSHIE PATENT FIRM (JP)
It can exceed and is a patent business corporation. (JP)
It can exceed and is a patent business corporation. (JP)
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