TEST CLAMP AND TEST APPARATUS

WIPO Patent Application WO/2024/031978

A1

Provided in the present disclosure are a test clamp and a test apparatus. The test clamp comprises a clamp assembly, a driving assembly and a heat dissipation assembly, wherein the clamp assembly comprises a cover plate, a probe plate and a bearing plate; the bearing plate is configured to bear a product to be tested, and the bearing plate is provided with a through hole and a through slot; the cover plate is configured to cover said product borne on the bearing plate; the probe plate is located below the bearing plate, and the probe plate is provided with a probe; the driving assembly is connected to the probe plate, and the driving assembly is configured to drive the probe plate to move up and down; when moving upwards, the probe plate drives the probe to pass through the through hole to come into contact with a test site of said product, thereby collecting a test signal; and the heat dissipation assembly is connected to the probe plate, and when the probe plate moves upwards, the probe plate drives the heat dissipation assembly to pass through the through slot to come into contact with a heating element of said product, thereby dissipating the heat of the heating element.

CHEN MINGLIANG (CN)
WU BO (CN)
LI XIN (CN)
HAO PEIZHENG (CN)
WANG HUARONG (CN)

PCT/CN2023/080501

February 15, 2024

March 09, 2023

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ZTE CORP (CN)

G01R31/28; H05K7/20

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CN215728239U	2022-02-01
US20150260793A1	2015-09-17

YUHONG INTELLECTUAL PROPERTY LAW FIRM et al. (CN)

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