Title:
TEST CONDITION DETERMINATION DEVICE
Document Type and Number:
WIPO Patent Application WO/2023/153287
Kind Code:
A1
Abstract:
The problem to be solved by the present disclosure is to provide a test condition determination device with which pattern setup mistakes can be avoided when signal patterns are set up for items of data. In a test device (10) which is the test condition determination device, a CPU (11) acquires tag information from a chiller (30) and determines a signal pattern for a loop test from the acquired tag information and a database in which the tag information and test signal patterns are associated with each other. Therefore, the work of setting up the signal pattern for the loop test by a service person is simplified, thereby decreasing man-hours for the work while also reducing setup mistakes.
Inventors:
NAKAHARA TAKAYUKI
Application Number:
PCT/JP2023/003213
Publication Date:
August 17, 2023
Filing Date:
February 01, 2023
Export Citation:
Assignee:
DAIKIN IND LTD (JP)
International Classes:
G05B23/02
Foreign References:
| JP2019207616A | 2019-12-05 | |||
| JP6865942B1 | 2021-04-28 | |||
| JP2019215792A | 2019-12-19 | |||
| JPH10307609A | 1998-11-17 | |||
| JP2017191386A | 2017-10-19 |
Attorney, Agent or Firm:
SHINJYU GLOBAL IP (JP)
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