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Title:
TEST METHOD AND TEST APPARATUS FOR APPLICATION MEMORY OF SMART DEVICE
Document Type and Number:
WIPO Patent Application WO/2019/051714
Kind Code:
A1
Abstract:
A test method for an application memory of a smart device. The test method comprises: writing, for an application of a smart device, a test scenario corresponding to the application, and configuring at least one test case based on the application according to the test scenario (101); configuring a test execution file based on the test case according to information of the test case (102); executing the test case according to the test execution file to obtain a memory output result of the test case (103); and comparing the memory output result with a memory expectation result to obtain a test result of the test case (104). The method simplifies the writing and maintenance of test cases.

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Inventors:
LIU YINYIN (CN)
Application Number:
PCT/CN2017/101744
Publication Date:
March 21, 2019
Filing Date:
September 14, 2017
Export Citation:
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Assignee:
SHENZHEN TRANSSION COMMUNICATION LTD (CN)
International Classes:
G06F11/36
Foreign References:
CN105786693A2016-07-20
CN102541723A2012-07-04
CN105975394A2016-09-28
CN101984416A2011-03-09
US8127275B12012-02-28
Attorney, Agent or Firm:
BEIJING DACHENG LAW OFFICES. LLP (CN)
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