Title:
TEST METHOD, TEST EQUIPMENT AND COMPUTER STORAGE MEDIUM
Document Type and Number:
WIPO Patent Application WO/2023/231273
Kind Code:
A1
Abstract:
Provided in the present disclosure are a test method, test equipment and a computer storage medium. The method comprises: determining an initial clock signal; generating a target clock signal on the basis of the initial clock signal; acquiring test data, wherein the test data comprises first test data and second test data; after the first test data is sequentially written into a target storage area of a chip under test according to a first-type flip moment of the target clock signal, sequentially writing the second test data into the target storage area of said chip according to a second-type flip moment of the target clock signal; according to the first-type flip moment and the second-type flip moment of the target clock signal, respectively performing data reading sampling on the target storage area of said chip, so as to determine first sampling data and second sampling data; and determining a test result on the basis of a comparison result of the first test data and the first sampling data and a comparison result of the second test data and the second sampling data.
Inventors:
LU HUAN (CN)
WANG PENG (CN)
WANG PENG (CN)
Application Number:
PCT/CN2022/126179
Publication Date:
December 07, 2023
Filing Date:
October 19, 2022
Export Citation:
Assignee:
CHANGXIN MEMORY TECH INC (CN)
International Classes:
G11C29/56
Foreign References:
| CN1493988A | 2004-05-05 | |||
| CN1606091A | 2005-04-13 | |||
| CN104810060A | 2015-07-29 | |||
| CN208422419U | 2019-01-22 | |||
| US6212113B1 | 2001-04-03 | |||
| KR20060015208A | 2006-02-16 |
Attorney, Agent or Firm:
CHINA PAT INTELLECTUAL PROPERTY OFFICE (CN)
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