Title:
TEST SOCKET
Document Type and Number:
WIPO Patent Application WO/2023/080533
Kind Code:
A1
Abstract:
The present invention is to provide a test socket that has a minimum length suitable for the electrical testing of a semiconductor device and has stable stroke and excellent electrical characteristics. The test socket according to an embodiment of the present invention comprises at least one layer of a spiral plate stacked via the central or outer portion.
Inventors:
KIM DONG IL (KR)
SONG BYUNG CHANG (KR)
KOO CHEOL HOE (KR)
KIM WON WOO (KR)
SHIM YUN HEE (KR)
HEO JIN HYANG (KR)
OH TAE SEUNG (KR)
KIM YONG KI (KR)
HAM JU WON (KR)
SONG BYUNG CHANG (KR)
KOO CHEOL HOE (KR)
KIM WON WOO (KR)
SHIM YUN HEE (KR)
HEO JIN HYANG (KR)
OH TAE SEUNG (KR)
KIM YONG KI (KR)
HAM JU WON (KR)
Application Number:
PCT/KR2022/016505
Publication Date:
May 11, 2023
Filing Date:
October 26, 2022
Export Citation:
Assignee:
AMST CO LTD (KR)
International Classes:
G01R1/04; G01R31/28
Foreign References:
| KR101921291B1 | 2019-02-13 | |||
| KR20210089444A | 2021-07-16 | |||
| KR102080832B1 | 2020-02-24 | |||
| KR20200115782A | 2020-10-08 | |||
| KR20190065460A | 2019-06-11 |
Attorney, Agent or Firm:
PARK, Keon Woo et al. (KR)
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