Title:
TESTING APPARATUS AND TESTING METHOD
Document Type and Number:
WIPO Patent Application WO/2007/116765
Kind Code:
A1
Abstract:
A testing apparatus is provided for testing a device, which is to be tested and is
provided with a receiving circuit for receiving a signal transmitted through a
communication cable. The testing apparatus is provided with a waveform generating section
for outputting waveform data for fixing a waveform to be supplied to the input
terminal of the receiving circuit; a digital filter, which has filter characteristics substantially
reverse to the attenuation characteristics of the communication cable and outputs
amplified waveform data obtained by amplifying the waveform data; a DA converter
for converting the amplified waveform data into analog waveform; and a lowpass
filter, which has substantially the same attenuation characteristics as those
of the communication cable, attenuates the analog waveform and supplies the
receiving circuit with the attenuated analog waveform.
Inventors:
UEDA MOTOO (US)
Application Number:
PCT/JP2007/056479
Publication Date:
October 18, 2007
Filing Date:
March 27, 2007
Export Citation:
Assignee:
ADVANTEST CORP (JP)
UEDA MOTOO (US)
UEDA MOTOO (US)
International Classes:
G01R31/28
Domestic Patent References:
| WO1998010590A1 | 1998-03-12 |
Foreign References:
| JPH02111126A | 1990-04-24 | |||
| JPH10307168A | 1998-11-17 | |||
| JPH11317710A | 1999-11-16 |
Attorney, Agent or Firm:
RYUKA, Akihiro (22-1 Nishi-Shinjuku 6-chome, Shinjuku-k, Tokyo 05, JP)
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