Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
THERMAL CONDUCTIVITY DETECTOR
Document Type and Number:
WIPO Patent Application WO/2022/091244
Kind Code:
A1
Abstract:
The present invention comprises: a first flow path (4) along which a filament (2) is disposed; a second flow path (6) which is provided separately from the first flow path (4); an introduction flow path (8) which achieves fluid communication between the upstream end of the first flow path (4) and the upstream end of the second flow path (6); a sample inlet (10) which is for introducing a sample gas into the introduction flow path (8); a first gas inlet (12) which is provided between the sample inlet (10) on the introduction flow path (8) and the upstream end of the first flow path (4); a second gas inlet (14) which is provided between the sample inlet (10) on the introduction flow path (8) and the upstream end of the second flow path (6); a carrier gas supply source (18); a selector (22) which selectively guides carrier gas from the carrier gas supply source (18) to one of the first gas inlet (12) and the second gas inlet (14); and a detection circuit (24) which is for detecting a component in the sample gas via the filament (2). When the carrier gas from the carrier gas supply source (18) is guided to the first gas inlet (12), a reference phase is formed in which only the carrier gas flows through the first flow path (4). When the carrier gas from the carrier gas supply source (18) is guided to the second gas inlet (14), a sampling phase is formed in which the sample gas glows through the first flow path (4). Fluid resistance in the first flow path (4) and fluid resistance in the second flow path (6) are designed such that the difference between a reference flow rate, which is the flow rate of gas flowing through the first flow path (4) in the reference phase, and a sampling flow rate, which is the flow rate of gas flowing through the first flow path (4) in the sampling phase, is not more than 15% with respect to the reference flow rate and with respect to sampling flow rate.

Inventors:
NAKAMA YUJI (JP)
Application Number:
PCT/JP2020/040391
Publication Date:
May 05, 2022
Filing Date:
October 28, 2020
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
SHIMADZU CORP (JP)
International Classes:
G01N25/18; G01N30/66
Domestic Patent References:
WO2020059279A12020-03-26
Foreign References:
JP2018040697A2018-03-15
US7185527B22007-03-06
JP2016142688A2016-08-08
US6928858B22005-08-16
US7185527B22007-03-06
Attorney, Agent or Firm:
NOGUCHI Daisuke (JP)
Download PDF: