Title:
THREE-DIMENSIONAL MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2023/176127
Kind Code:
A1
Abstract:
This three-dimensional measurement device comprises: a projection unit (20) which projects a specified stripe pattern onto a to-be-measured object; an image capture unit (30) which captures an image of the to-be-measured object onto which the specified stripe pattern has been projected; a measurement unit (40) which uses stripe pattern information determined from the image captured by the image capture unit (30) to measure the three-dimensional shape of the to-be-measured object by a phase-shift method; and a control unit (11) which controls the projection unit (20). When the measurement unit (40) uses stripe pattern information determined from an image captured by the image capture unit (30) to measure the three-dimensional shape of a to-be-measured object R by a phase-shift method, said measurement unit (40) determines the stripe pattern information in pixel units in the captured image on the basis of: the time difference between the output timings of pre-event data and post-event data outputted from each image capture element in a unit time period T; and the polarity of the post-event data.
Inventors:
MITANI YUSUKE (JP)
Application Number:
PCT/JP2023/001153
Publication Date:
September 21, 2023
Filing Date:
January 17, 2023
Export Citation:
Assignee:
DENSO WAVE INC (JP)
International Classes:
G01B11/25
Domestic Patent References:
| WO2022050279A1 | 2022-03-10 |
Foreign References:
| JP2021067644A | 2021-04-30 | |||
| JP2020136958A | 2020-08-31 |
Attorney, Agent or Firm:
JIN Shunji (JP)
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