Title:
THREE-DIMENSIONAL MEASURING INSTRUMENT, THREE-DIMENSIONAL MEASURING METHOD, AND THREE-DIMENSIONAL MEASURING PROGRAM
Document Type and Number:
WIPO Patent Application WO/2006/054425
Kind Code:
A1
Abstract:
A three-dimensional measuring instrument, method, and program for acquiring much of pattern light information by a single projection and high-precision three-dimensional information at high speed. The three-dimensional measuring instrument comprises a pattern projector (1) serving as projecting means for projecting a pattern light toward a measurement object (A), a camera (2) serving as imaging means for capturing an image of the measurement object (A) toward which the pattern light is projected, and a computer (3) for processing data on the image captured by the camera (2). The computer (3) computes the angle of direction of each of the individual pattern lights constituting the projected pattern light from the value of the intensity of the projected pattern light detected from the captured image, divides the intensity distribution, and computes the depth distance from the phase value at each measuring point of the divided pattern. Thus, high-precision three-dimensional information is acquired.
Inventors:
LU CUNWEI (JP)
Application Number:
PCT/JP2005/019511
Publication Date:
May 26, 2006
Filing Date:
October 24, 2005
Export Citation:
Assignee:
SCHOOL JURIDICAL PERSON OF FUK (JP)
LU CUNWEI (JP)
LU CUNWEI (JP)
International Classes:
G01B11/25; G06T1/00; G06V10/145
Foreign References:
| JP2004077290A | 2004-03-11 | |||
| JPH03289505A | 1991-12-19 |
Attorney, Agent or Firm:
Kato, Hisashi (Asaco-Hakata Bldg. 11-5, Hakataekihiga shi 1-chom, Hakata-ku Fukuoka-shi Fukuoka 13, JP)
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