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Title:
THRESHOLD VOLTAGE MEASUREMENT METHOD AND APPARATUS, AND DISPLAY APPARATUS
Document Type and Number:
WIPO Patent Application WO/2023/108778
Kind Code:
A1
Abstract:
A threshold voltage measurement method. The driving current flowing through a driving transistor (DT) in a measurement process is maintained constant by means of a new measurement time sequence. Then, the voltage of a drain of the DT is raised to a preset voltage within a measurement time period after multiple iterations in an iteration mode, so as to obtain a target threshold voltage.

Inventors:
DOU WEI (CN)
Application Number:
PCT/CN2021/140624
Publication Date:
June 22, 2023
Filing Date:
December 22, 2021
Export Citation:
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Assignee:
SHENZHEN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECH CO LTD (CN)
International Classes:
G09G3/00; G09G3/3208; G09G3/3233; G09G3/3258
Foreign References:
CN112562557A2021-03-26
CN106097943A2016-11-09
CN106782320A2017-05-31
CN108510922A2018-09-07
CN109119026A2019-01-01
US20100321367A12010-12-23
JP2009098166A2009-05-07
Attorney, Agent or Firm:
PURPLEVINE INTELLECTUAL PROPERTY (SHENZHEN) CO., LTD. (CN)
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