Title:
TRANSMITTER AND CARRIER LEAK DETECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2007/100114
Kind Code:
A1
Abstract:
It is possible to compensate a carrier leak for any carrier arrangement. A transmitter
includes; carrier leak compensation means (2) for adding a compensation value
to a transmission signal which has been inputted; an analog orthogonal modulator
(4); feedback means (5-7) for receiving a part of an output signal from the analog
orthogonal modulator, performing orthogonal detection, and outputting a feedback
signal in which each carrier has a frequency identical to the transmission signal;
carrier leak detection means (800) for detecting an I-phase and a Q-phase carrier
leak according to a difference between the feedback signal having an amplitude
and a phase which have been adjusted and the transmission signal; and carrier
leak compensation value control means (9) for updating the compensation value
according to the detected carrier leak. It should be noted that the number of samples
for detecting the amplitude and the phase may be smaller than the number of samples
to be accumulated.
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Inventors:
OKADA TAKASHI (JP)
TODATE TAKAHIRO (JP)
TAKEUCI YASUHIRO (JP)
OKAZAKI TAKASHI (JP)
CHIBA MASAHARU (JP)
TODATE TAKAHIRO (JP)
TAKEUCI YASUHIRO (JP)
OKAZAKI TAKASHI (JP)
CHIBA MASAHARU (JP)
Application Number:
PCT/JP2007/054112
Publication Date:
September 07, 2007
Filing Date:
February 26, 2007
Export Citation:
Assignee:
HITACHI INT ELECTRIC INC (JP)
OKADA TAKASHI (JP)
TODATE TAKAHIRO (JP)
TAKEUCI YASUHIRO (JP)
OKAZAKI TAKASHI (JP)
CHIBA MASAHARU (JP)
OKADA TAKASHI (JP)
TODATE TAKAHIRO (JP)
TAKEUCI YASUHIRO (JP)
OKAZAKI TAKASHI (JP)
CHIBA MASAHARU (JP)
International Classes:
H04L27/20; H03D7/00; H04B1/04; H04J1/00
Domestic Patent References:
WO2003101061A1 | 2003-12-04 |
Foreign References:
JP2006050331A | 2006-02-16 | |||
JPH0522356A | 1993-01-29 | |||
JP2001016283A | 2001-01-19 | |||
JP2004222259A | 2004-08-05 | |||
JP2004363757A | 2004-12-24 |
Attorney, Agent or Firm:
MORIYAMA, Tatsuo et al. (7-10 Ebisu-nishi 2-chome, Shibuya-k, Tokyo 21, JP)
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