Title:
TRANSPARENT OBJECT RECONSTRUCTION METHOD AND SYSTEM BASED ON MULTIWAVELENGTH RAY TRACING
Document Type and Number:
WIPO Patent Application WO/2022/057055
Kind Code:
A1
Abstract:
The present invention provides a transparent object reconstruction method and system based on multiwavelength ray tracing. The method comprises: calculating, by using internal parameters of camera calibration, to obtain a reverse ray equation of a pixel point of a camera; placing a transparent object on a display screen, a backlight lighting source emitting two or more different wavelengths of rays to the display screen, and recording location information of the rays on the display screen; translating the display screen along the direction perpendicular to the display screen, and calculating linear equations of the different wavelengths of rays from the lower surface of the transparent object to the display screen and recorded by the pixel point; reversely tracing, by means of the pixel point, refracted rays of the different wavelengths of rays inside the transparent object, and combining the above ray equations to uniquely determine three-dimensional information of a point on the upper surface and multiple points on the lower surface of the transparent object; and repeating all the above steps, and calculating three-dimensional coordinates of the remaining points on the surface of the transparent object according to imaging optical path information of different pixel points of the camera. Thus, high-precision and high-robustness three-dimensional reconstruction of a transparent object is achieved.
Inventors:
WU QINGYANG (CN)
LU XIAOTING (CN)
HUANG HAOTAO (CN)
ZHANG ZHIJUN (CN)
DENG YIFENG (CN)
LU XIAOTING (CN)
HUANG HAOTAO (CN)
ZHANG ZHIJUN (CN)
DENG YIFENG (CN)
Application Number:
PCT/CN2020/127137
Publication Date:
March 24, 2022
Filing Date:
November 06, 2020
Export Citation:
Assignee:
UNIV SHENZHEN TECHNOLOGY (CN)
International Classes:
G01B11/25
Foreign References:
| CN107240148A | 2017-10-10 | |||
| CN109118531A | 2019-01-01 | |||
| US20160238381A1 | 2016-08-18 |
Other References:
HAO ZHICHAO, LIU YUAN-KUN: "Transparent Object Shape Measurement Based on Deflectometry", OPTICS & OPTOELECTRONIC TECHNOLOGY, vol. 17, no. 1, 10 February 2019 (2019-02-10), pages 63 - 69, XP055912588, DOI: 10.19519/j.cnki.1672-3392.2019.01.012
Attorney, Agent or Firm:
HENSEN INTELLECTUAL PROPERTY FIRM (CN)
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