VERTICAL PROBE CARD - POINT ENGINEERING CO LTD

Title:

VERTICAL PROBE CARD

Document Type and Number:

WIPO Patent Application WO/2023/033372

Kind Code:

A1

Abstract:

Proposed is a vertical probe card capable of effectively testing the electrical characteristics of a test object without a body thereof being elastically bent or curved in a convex shape in the horizontal direction by pressure applied to opposite ends thereof.

Inventors:

AHN BUM MO (KR)
PARK SEUNG HO (KR)
BYUN SUNG HYUN (KR)

Application Number:

PCT/KR2022/011156

Publication Date:

March 09, 2023

Filing Date:

July 29, 2022

Export Citation:

Click for automatic bibliography generation Help

Assignee:

POINT ENGINEERING CO LTD (KR)

International Classes:

G01R1/073; G01R1/067

Foreign References:

US20210239735A1	2021-08-05
JP2019082378A	2019-05-30
KR20170090586A	2017-08-08
JP2012145593A	2012-08-02
JP2018197714A	2018-12-13

Attorney, Agent or Firm:

CHOI, Kwang Seok (KR)

Download PDF:

View/Download PDF PDF Help

Previous Patent: APPARATUS AND METHOD FOR NOTCHING ELECTRODE SUBSTRATE

Next Patent: METHOD FOR TRANSMITTING SIGNAL USING PORT VIRTUALIZATION MATRIX, AND ELECTRONIC DEVICE PERFORMING ME...