Title:
VIBRATION COMPONENT MEASURING DEVICE, KELVIN PROBE FORCE SPECTROMETER, VIBRATION COMPONENT MEASURING METHOD, AND INTERFACE STATE DENSITY MEASURING METHOD
Document Type and Number:
WIPO Patent Application WO/2024/004551
Kind Code:
A1
Abstract:
In order to measure a change in a fluctuating component of a vibrating unit more efficiently, and to calculate an interface state density of a sample more efficiently, a vibration component measuring device (2) comprises: a vibrating unit (4); a vibration control unit (10) for causing the vibrating unit to vibrate on the basis of a first alternating current signal; a signal applying unit (14, 48) for applying at least one of a direct current signal, a second alternating current signal, and a reference alternating current signal between the vibrating unit and a sample; and a measuring unit (42, 44) for measuring a fluctuating component of the vibration of the vibrating unit. The measuring unit measures a change in the fluctuating component with respect to a change in a voltage value of the direct current signal.
Inventors:
SUGAWARA YASUHIRO (JP)
Application Number:
PCT/JP2023/021102
Publication Date:
January 04, 2024
Filing Date:
June 07, 2023
Export Citation:
Assignee:
UNIV OSAKA (JP)
International Classes:
G01Q60/30; G01Q60/32
Domestic Patent References:
| WO2021193799A1 | 2021-09-30 | |||
| WO2013038659A1 | 2013-03-21 |
Foreign References:
| JP2008058107A | 2008-03-13 |
Attorney, Agent or Firm:
HARAKENZO WORLD PATENT & TRADEMARK (JP)
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