VOLTAGE TEST CIRCUIT AND VOLTAGE TEST METHOD

WIPO Patent Application WO/2023/240703

A1

A voltage test circuit and a voltage test method. The voltage test circuit comprises: a threshold setting module (11), which is provided with a first input end, a second input end and a power supply end, wherein the first input end is used for receiving a voltage Vs to be measured, the second input end is used for receiving a threshold regulation signal SCON, and the power supply end is used for connecting to a first voltage V1, and is used for setting a voltage regulation range according to the threshold regulation signal SCON, determining a first voltage regulation value △V1 within the voltage regulation range according to the voltage Vs to be measured, and generating a control voltage VN1 according to the first voltage V1 and the first voltage regulation value △V1; and a voltage conversion module (12), of which an input end receives the control voltage VN1 by means of a first node and is used for outputting a first level when the control voltage VN1 is greater than a preset value, and outputting a second level when the control voltage VN1 is less than or equal to the preset value. The voltage test circuit can realize flexible regulation of a voltage test threshold by means of one circuit.

QIU ANPING (CN)

PCT/CN2022/102957

December 21, 2023

June 30, 2022

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CHANGXIN MEMORY TECH INC (CN)

H03K5/22

CN102075168A	2011-05-25
CN101500358A	2009-08-05
CN103618522A	2014-03-05
JP2003163582A	2003-06-06
US6166566A	2000-12-26
US9746501B1	2017-08-29

BEIJING INTELLEGAL INTELLECTUAL PROPERTY AGENT LTD. (CN)

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