Title:
WAVEFRONT-SPLITTING ONE-WAY ORTHOGONAL OPTICAL PATH INTERFEROMETER
Document Type and Number:
WIPO Patent Application WO/2023/029978
Kind Code:
A1
Abstract:
A wavefront splitting-based interferometer apparatus which is formed by means of an orthogonal beam combining manner, an optical transmission path of a reference beam and measurement beam of which is one-way, and which can be used for the precise measurement of physical parameters such as the anisotropic parameters, distance, speed, displacement, inclination angle, motion state, and flow velocity of a substance to be measured. An interference-based measurement means is a detection means in which by means of superposing two coherent optical signals that are spatially orthogonal, a two-signal phase difference is then derived by a superposed field intensity signal measured by a photoelectric sensor; and is a method that uses an observed phase difference when a spatial feature vector and effective beam of a target to be measured are perpendicular and parallel so as to inversely calculate the physical quantity of anisotropic features of the target. There are two basic types of design modes: one consists of a 2D plane structured optical path formed on the basis of a signal delayer and an optical path deflector (12), and the other consists of a 3D stereoscopic structured optical path formed on the basis of dual optical path deflectors (21, 22); and the two designs have the same function.
Inventors:
DONG SHI (CN)
Application Number:
PCT/CN2022/112654
Publication Date:
March 09, 2023
Filing Date:
August 16, 2022
Export Citation:
Assignee:
DONG SHI (CN)
International Classes:
G01B9/02
Foreign References:
| CN106716088A | 2017-05-24 | |||
| CN108692663B | 2020-04-21 | |||
| CN101963495A | 2011-02-02 | |||
| CN103105284A | 2013-05-15 | |||
| US20190219378A1 | 2019-07-18 | |||
| US20190145831A1 | 2019-05-16 |
Download PDF: