Title:
WEIGHING PERFORMANCE CONFIRMATION METHOD FOR SCALE AND SCALE FOR SAME
Document Type and Number:
WIPO Patent Application WO/2022/138124
Kind Code:
A1
Abstract:
The present invention addresses the problem of confirming the weighing performance of an electronic scale under conditions close to those of actual use by a user. In order to solve this problem, an electronic scale (1) comprises a weighing pan (2), a windscreen (3), a gate opening/closing mechanism (12) that automatically opens and closes gates (33, 34) of the windscreen, a weight sensor (11), a built-in counterweight (13), a counterweight loading/unloading mechanism (14) for the built-in counterweight, and a control unit (15). The control unit measures the standard deviation of the built-in counterweight as a standard deviation for actual use (SDreal) in the course of a series of opening and closing actions in which the gates are opened by the gate opening/closing mechanism, the built-in counterweight is loaded by the counterweight loading/unloading mechanism, the gates are closed using the gate opening/closing mechanism, weighing data for the built-in counterweight is acquired, the gates are opened by the gate opening/closing mechanism, the built-in counterweight is unloaded by the counterweight loading/unloading mechanism, and the gates are closed by the gate opening/closing mechanism,
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Inventors:
OKABE KAZUNA (JP)
ODA HISANORI (JP)
ODA HISANORI (JP)
Application Number:
PCT/JP2021/044824
Publication Date:
June 30, 2022
Filing Date:
December 07, 2021
Export Citation:
Assignee:
A&D CO LTD (JP)
International Classes:
G01G23/01; G01G21/30
Domestic Patent References:
WO2006082915A1 | 2006-08-10 |
Foreign References:
JPH0723239U | 1995-04-25 | |||
JP2012007970A | 2012-01-12 | |||
JPS62280624A | 1987-12-05 | |||
US20160250628A1 | 2016-09-01 | |||
JP4851882B2 | 2012-01-11 | |||
JP5062880B2 | 2012-10-31 | |||
US5062880A | 1991-11-05 | |||
JP2020011748W | 2020-03-17 |
Other References:
See also references of EP 4269959A4
Attorney, Agent or Firm:
YAGI Hidehito et al. (JP)
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