Title:
WIRELESS APPARATUS AND METHOD FOR MANUFACTURING SAME
Document Type and Number:
WIPO Patent Application WO/2013/069213
Kind Code:
A1
Abstract:
This wireless apparatus has a substrate, a high frequency IC chip for a power amplifier, and a process variance detecting unit. The process variance detecting unit monitors quantities of circuit characteristic fluctuations due to process variance. An underfill having parameters calculated using the monitored circuit characteristic fluctuation quantities is applied to between the substrate and the high frequency IC chip. As a result, desired circuit characteristics can be obtained in the wireless apparatus, even if there have been the process variance and underfill influence.
Inventors:
TSUKIZAWA TAKAYUKI
Application Number:
PCT/JP2012/006727
Publication Date:
May 16, 2013
Filing Date:
October 19, 2012
Export Citation:
Assignee:
PANASONIC CORP (JP)
International Classes:
H04B1/40; H01L21/56; H01L21/60; H01L21/66; H01L21/822; H01L23/12; H01L27/04; H03F1/30; H03F3/213
Foreign References:
| JP2006294826A | 2006-10-26 | |||
| JP2004319828A | 2004-11-11 | |||
| JPH113916A | 1999-01-06 | |||
| JP2006351810A | 2006-12-28 |
Attorney, Agent or Firm:
HASHIMOTO, Kimihide et al. (JP)
Kimihide Hashimoto (JP)
Kimihide Hashimoto (JP)
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Claims: