X-RAY ANALYSIS DEVICE AND METHOD

WIPO Patent Application WO/2013/073238

A1

This X-ray analysis device: emits a primary X-ray (2) while causing the sample (S) to rotate about a predetermined point on the sample (S); acquires and stores a diffraction pattern in which the intensity of a secondary X-ray (4) generated in the sample (S) is associated with the rotation angle of the sample (S); scans the diffraction pattern along a straight line representing the intensity of the secondary X-ray (4) in the direction of higher and lower intensities, and sets, as candidate points, points on the diffraction pattern having an intensity equal to or less than the intensity represented by the straight line while the scanning is performed; stores the rotation angles of the candidate points when the maximum value of the difference in rotation angles between adjacent candidate points is equal to a predetermined angle; reads, from amongst the stored rotation angles of the candidate points, the rotation angle that is nearest to the coordinates of the point of measurement of the sample (S), according to the coordinates of the point of measurement; and sets the sample (S) at the rotation angle that has been read and places the point of measurement of the sample (S) in the visual field (V) of the detector (7).

FUKUDA TOMOYUKI (JP)
SHIMIZU KOSUKE (JP)
IKESHITA AKIHIRO (JP)

PCT/JP2012/069979

May 23, 2013

August 06, 2012

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RIGAKU DENKI CO LTD (JP)
FUKUDA TOMOYUKI (JP)
SHIMIZU KOSUKE (JP)
IKESHITA AKIHIRO (JP)

G01N23/223

JP2009210507A	2009-09-17
JPH05126768A	1993-05-21
JPH0566204A	1993-03-19
JPH10282022A	1998-10-23

SUGIMOTO, Shuji et al. (JP)
Shuji Sugimoto (JP)

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