Title:
X-RAY ANALYSIS DEVICE, X-RAY ANALYSIS SYSTEM, ANALYSIS METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2020/121918
Kind Code:
A1
Abstract:
The present invention executes component determination in consideration of various influences included in a fluorescence X-ray spectrum. This X-ray analysis device (100) is provided with a measurement device (1) and an analysis device (5). The measurement device (1) measures a fluorescence X ray spectrum generated from a sample (S) to be measured. The analysis unit (5) analyzes the sample (S) from which a second fluorescence X-ray spectrum is generated on the basis of second result information obtained by inputting a second parameter about the measured second fluorescence X-ray spectrum to a training model that has been trained by using teacher data including a first parameter about the first fluorescence X-ray spectrum and first result information about an analysis result when the first parameter is used.
Inventors:
AOYAMA TOMOKI (JP)
BAMBA TOMOHIRO (JP)
BAMBA TOMOHIRO (JP)
Application Number:
PCT/JP2019/047478
Publication Date:
June 18, 2020
Filing Date:
December 04, 2019
Export Citation:
Assignee:
HORIBA LTD (JP)
International Classes:
G01N23/223
Domestic Patent References:
| WO2018117146A1 | 2018-06-28 |
Foreign References:
| JP2007003532A | 2007-01-11 | |||
| JPH01213949A | 1989-08-28 | |||
| JPS63108253A | 1988-05-13 | |||
| US20180243800A1 | 2018-08-30 |
Attorney, Agent or Firm:
WATANABE, Hisashi et al. (JP)
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