Title:
X-RAY DIAGNOSIS EQUIPMENT AND LONG-LENGTH IMAGE GENERATION METHOD
Document Type and Number:
WIPO Patent Application WO/2010/113999
Kind Code:
A1
Abstract:
Provided are an X-ray diagnosis equipment and a long-length image generation method which are used for generating a long-length image while suppressing radiation exposure to an examinee (100). The X-ray diagnosis equipment comprises an X-ray generation unit (60) for irradiating the examinee (100) with X rays, an X-ray detection unit (70) for detecting an X-ray signal based on the X rays passing through the examinee (100), a driving unit (130) for moving an image system including the X-ray generation unit (60) and the X-ray detection unit (70), a position sensor for detecting the position information of the image system, an image processing unit (112) for adding a plurality of fluoroscopic image frames based on the X-ray signals obtained by the X-ray detection unit (70) on the basis of the detected position information to generate a long-length image, and a display unit (80) for displaying the long-length image.
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Inventors:
OHMURA EIJI (JP)
Application Number:
PCT/JP2010/055799
Publication Date:
October 07, 2010
Filing Date:
March 31, 2010
Export Citation:
Assignee:
HITACHI MEDICAL CORP (JP)
OHMURA EIJI (JP)
OHMURA EIJI (JP)
International Classes:
A61B6/00
Foreign References:
| JP2007195612A | 2007-08-09 |
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