X-RAY FLUORESCENCE ANALYSIS SYSTEM

Title:

X-RAY FLUORESCENCE ANALYSIS SYSTEM

Document Type and Number:

WIPO Patent Application WO/2019/244432

Kind Code:

A1

Abstract:

Provided is an X-ray fluorescence analysis system that makes accurate measurement time calculation possible. This X-ray fluorescence analysis system analyzes a sample using X-ray fluorescence generated as a result of the irradiation of primary X-rays onto the surface of the sample. The X-ray fluorescence analysis system comprises: a job execution unit for executing a job expressing processing conditions associating a recipe representing measurement conditions configured through the combination of a plurality of operations necessary for analysis and a sample to be measured under the measurement conditions represented by the recipe; a storage unit for advance storage of the times required for each operation in association with the same; a calculation unit for, for each job, using the times stored in the storage unit to calculate the time until the completion of the execution of the job when the same is generated; and a control unit for, when a job is executed, newly storing the times required for operations in the storage unit in association with the operations. Additionally, if a job has been executed, the calculation unit uses the newly stored times in the storage unit to calculate the time until the completion of the execution of the job.

Inventors:

KITA HIROAKI (JP)
KURITA SEIITSU (JP)

Application Number:

PCT/JP2019/013748

Publication Date:

December 26, 2019

Filing Date:

March 28, 2019

Export Citation:

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Assignee:

RIGAKU DENKI CO LTD (JP)

International Classes:

G01N23/223

Foreign References:

JP2010078592A	2010-04-08
JPH0934731A	1997-02-07
CN204101574U	2015-01-14
JP2012189399A	2012-10-04
JP2001338601A	2001-12-07
JPS5961779A	1984-04-09
JPH05107051A	1993-04-27
JPS6338148A	1988-02-18

Other References: