Title:
X-RAY IMAGING DEVICE
Document Type and Number:
WIPO Patent Application WO/2020/129213
Kind Code:
A1
Abstract:
This X-ray imaging device (100) is configured such that when a first X-ray image and a second X-ray image are superimposed and displayed such that the images are offset in the X direction by an amount corresponding to the amount of movement (of the X-ray detection position), an image processing unit (3b) divides the pixel value of a first pixel (E1) of the first X-ray image (10) in the X direction on the basis of the pixel values of two pixels (E) in the second X-ray image (20) which overlap the first pixel (E1) and thereby generates a super-resolution image (Ib) having higher resolution in the X direction than the first X-ray image and the second X-ray image.
Inventors:
NIIZAKA TAKUMA (JP)
Application Number:
PCT/JP2018/046996
Publication Date:
June 25, 2020
Filing Date:
December 20, 2018
Export Citation:
Assignee:
SHIMADZU CORP (JP)
International Classes:
A61B6/00
Domestic Patent References:
| WO2017007024A1 | 2017-01-12 |
Foreign References:
| JP2018108364A | 2018-07-12 | |||
| JPH10155158A | 1998-06-09 | |||
| JP2017045431A | 2017-03-02 |
Other References:
YONEYAMA, AKIO ET AL.: "Non-official translation: Examination of high-resolution CT by S-17 X-ray sub-pixel shifting (SPS) method", SUNBEAM ANNUAL REPORT WITH RESEARCH RESULTS, vol. 4, no. 3, 2014, pages 122 - 123
Attorney, Agent or Firm:
MIYAZONO, Hirokazu (JP)
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