Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
X-RAY INSPECTION DEVICE AND X-RAY INSPECTION SYSTEM
Document Type and Number:
WIPO Patent Application WO/2022/045428
Kind Code:
A1
Abstract:
An X-ray inspection device is disclosed. The present X-ray inspection device comprises: an X-ray tube; a detector disposed so as to face the X-ray tube; and transfer devices which, for simultaneous X-ray inspection of at least two objects to be inspected, transfer at least two objects to be inspected to an inspection position between the X-ray tube and the detector.

Inventors:
KIM JONG HUI (KR)
Application Number:
PCT/KR2020/012355
Publication Date:
March 03, 2022
Filing Date:
September 14, 2020
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
SEC CO LTD (KR)
International Classes:
G01N23/18; B65G47/91; B65G61/00; G01N23/083
Foreign References:
KR20160029306A2016-03-15
KR100973689B12010-08-03
JP2007147313A2007-06-14
KR20180110905A2018-10-11
KR20150118492A2015-10-22
Attorney, Agent or Firm:
KIM, Tae-hun (KR)
Download PDF: