Title:
X-RAY INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2017/159855
Kind Code:
A1
Abstract:
The present invention addresses the problem of providing an X-ray inspection device that generates an image in which the position of a foreign object in an entire item is readily specified. An X-ray inspection device (10) in which an inspector can readily specify the position of a foreign object in a product (G) by a foreign object position-specifying image (P3), and the conventional need to "specify the position of a foreign object in an entire item while an image of the overall shape of the item and an image of the foreign object only are compared in alternating fashion" is therefore eliminated, and processability is improved.
Inventors:
KABUMOTO TAKASHI (JP)
TSUNO MASAO (JP)
TSUNO MASAO (JP)
Application Number:
PCT/JP2017/010932
Publication Date:
September 21, 2017
Filing Date:
March 17, 2017
Export Citation:
Assignee:
ISHIDA SEISAKUSHO (JP)
International Classes:
G01N23/04; G01N23/18
Foreign References:
| JP5884144B1 | 2016-03-15 | |||
| JP2011196796A | 2011-10-06 | |||
| JP2005091015A | 2005-04-07 | |||
| JP2007232586A | 2007-09-13 | |||
| JP2007024835A | 2007-02-01 | |||
| JP2013019689A | 2013-01-31 | |||
| JP5884145B1 | 2016-03-15 | |||
| JP2006064662A | 2006-03-09 |
Attorney, Agent or Firm:
SHINJYU GLOBAL IP (JP)
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