Title:
X-RAY PANORAMIC IMAGING APPARATUS
Document Type and Number:
WIPO Patent Application WO/2016/060449
Kind Code:
A1
Abstract:
The present invention relates to an X-ray panoramic imaging apparatus capable of acquiring more accurate X-ray panoramic images while minimizing the rotation of a rotation arm, the X-ray panoramic imaging apparatus comprising: at least one X-ray source for irradiating X-rays transmitting image layers within an arch section by section in the rear of the arch; an X-ray sensor for receiving, in the front of the arch, the X-rays that have transmitted the image layers within the arch section by section, wherein the at least one X-ray source is of a field emission type using an emitter of a nanostructure material.
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Inventors:
RO CHANG-JOON (KR)
Application Number:
PCT/KR2015/010798
Publication Date:
April 21, 2016
Filing Date:
October 13, 2015
Export Citation:
Assignee:
VATECH CO LTD (KR)
VATECH EWOO HOLDINGS CO LTD (KR)
VATECH EWOO HOLDINGS CO LTD (KR)
International Classes:
A61B6/14
Foreign References:
| KR20140008287A | 2014-01-21 | |||
| US20130136226A1 | 2013-05-30 | |||
| US5214686A | 1993-05-25 | |||
| KR20140106291A | 2014-09-03 | |||
| US20080059420A1 | 2008-03-06 |
Attorney, Agent or Firm:
NEIT INTERNATIONAL PATENT AND LAW FIRM (KR)
특허법인네이트 (KR)
특허법인네이트 (KR)
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