Title:
X-RAY PHASE IMAGING DEVICE
Document Type and Number:
WIPO Patent Application WO/2020/039654
Kind Code:
A1
Abstract:
This X-ray phase imaging device (100) is provided with a detecting unit (12) that detects X-rays emitted from an X-ray source (11), and a plurality of gratings (G) which are arranged between the X-ray source and the detecting unit and through which the X-rays emitted from the X-ray source pass. In addition, at least one of the plurality of gratings is configured so as to have a convex arc shape that protrudes toward the detecting unit side as seen from the X-ray source, and the grating having the arc shape is configured so as to perform fringe scanning by moving in an arc shape.
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Inventors:
SANO SATOSHI (JP)
TANABE KOICHI (JP)
WADA YUKIHISA (JP)
TOKUDA SATOSHI (JP)
TANABE KOICHI (JP)
WADA YUKIHISA (JP)
TOKUDA SATOSHI (JP)
Application Number:
PCT/JP2019/017375
Publication Date:
February 27, 2020
Filing Date:
April 24, 2019
Export Citation:
Assignee:
SHIMADZU CORP (JP)
International Classes:
G01N23/041; A61B6/00
Domestic Patent References:
| WO2015064723A1 | 2015-05-07 | |||
| WO2017001294A1 | 2017-01-05 |
Foreign References:
| JP2015529510A | 2015-10-08 | |||
| JP2015072261A | 2015-04-16 | |||
| JP2014190778A | 2014-10-06 | |||
| JP2014155509A | 2014-08-28 |
Attorney, Agent or Firm:
MIYAZONO, Hirokazu (JP)
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