Title:
X-RAY SOURCE AND OPERATING METHOD THEREFOR
Document Type and Number:
WIPO Patent Application WO/2022/136392
Kind Code:
A2
Abstract:
The invention relates to an x-ray source (100; 100a; 100b; 100c), comprising an electron source (110) for providing electrons (e) in the form of an electron beam (es) and a target element (120), on which the electrons (e) of the electron beam (es) of the electron source (110) are able to impinge, and at least one deflection device (140) enabling the electron beam (es) to be deflected from a propagation direction produced by the electron source (110), wherein the at least one deflection device (140) is configured to deflect the electron beam (es) at least intermittently with a trajectory (180) incident on the target element (120), but outside a center of the target element (120) or a region (150) of the target element (120) on which the electron beam (es) is incident in the case of a propagation direction without deflection, or wherein the at least one deflection device (140) is configured to deflect the electron beam (es) at least intermittently in such a way that the electron beam (es) is not incident on the target element (120).
Inventors:
MARTIN LEIBFRITZ (DE)
Application Number:
PCT/EP2021/087030
Publication Date:
June 30, 2022
Filing Date:
December 21, 2021
Export Citation:
Assignee:
HELMUT FISCHER GMBH INST FUER ELEKTRONIK UND MESSTECHNIK (DE)
International Classes:
H01J35/14; H01J35/30
Domestic Patent References:
| WO1999050882A1 | 1999-10-07 |
Attorney, Agent or Firm:
PATENTANWÄLTE MAMMEL UND MASER (DE)
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