Title:
X-RAY TUBE DEFECT SIGN DETECTION DEVICE, X-RAY TUBE DEFECT SIGN DETECTION METHOD, AND X-RAY DEVICE
Document Type and Number:
WIPO Patent Application WO/2015/111512
Kind Code:
A1
Abstract:
A data processing unit (11) provided with a frequency analyzer (21) for performing vibration frequency analysis, a noise level calculator (23) for calculating the level of noise produced outside an X-ray tube, and a defect sign detector (25) for detecting a sign of an X-ray tube defect. The defect sign detector (25), upon being triggered by the noise level calculated by the noise level calculator (23) falling to or below a predetermined threshold value, performs a frequency analysis on the vibration produced inside the X-ray tube through the frequency analyzer (21), and detects a sign of a detect on the basis of the analysis result.
Inventors:
NAKAHARA TAKASHI (JP)
YUDA SHINYA (JP)
AONO TAKANORI (JP)
INAHARA TETSU (JP)
TACHIKI SHIGERU (JP)
ABE KIYOMI (JP)
YUDA SHINYA (JP)
AONO TAKANORI (JP)
INAHARA TETSU (JP)
TACHIKI SHIGERU (JP)
ABE KIYOMI (JP)
Application Number:
PCT/JP2015/051041
Publication Date:
July 30, 2015
Filing Date:
January 16, 2015
Export Citation:
Assignee:
HITACHI MEDICAL CORP (JP)
International Classes:
H05G1/26; A61B6/03; H05G1/66
Foreign References:
| JPS61153932A | 1986-07-12 | |||
| JP2002280195A | 2002-09-27 | |||
| JP2001218762A | 2001-08-14 | |||
| JP2005241089A | 2005-09-08 | |||
| US20010031036A1 | 2001-10-18 | |||
| US20070189463A1 | 2007-08-16 |
Attorney, Agent or Firm:
ISONO Michizo (JP)
Michizo Isono (JP)
Michizo Isono (JP)
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