Title:
【発明の名称】電子制御装置の検査方法及びこの方法を使用する制御装置
Document Type and Number:
Japanese Patent JPH08508104
Kind Code:
A
Abstract:
PCT No. PCT/DE94/01516 Sec. 371 Date Oct. 3, 1995 Sec. 102(e) Date Oct. 3, 1995 PCT Filed Dec. 16, 1994 PCT Pub. No. WO95/18976 PCT Pub. Date Jul. 13, 1995The method for testing an electronic control device containing a microcomputer and a volatile memory for programs processed in the microcomputer includes transferring a program module for testing to the microcomputer (14) via a serial interface (SSO) prior to the testing, the program module including commands for executing individual data reading and writing operations in the control device (12) in response to respective test commands; writing the program module into the volatile memory (Code RAM) in the control device (12) prior to the testing; receiving test instructions including several test commands in the microcomputer (14) from an external test device (10) via the serial interface (SSO); processing the program module by the microcomputer (14) to test the control device (12); triggering a number of the individual data reading and writing operations in the control device (12) via the several test commands received in the control device (12); transferring data generated in the control device (12) during the processing of the program module and the triggering to the external test device and evaluating and/or displaying the data received in the external test device with the external test device.
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Inventors:
Matte, peter
Schmeet, Roland
Walther, Gerold
Mark, John-Jordan
Schmeet, Roland
Walther, Gerold
Mark, John-Jordan
Application Number:
JP51825695A
Publication Date:
August 27, 1996
Filing Date:
December 16, 1994
Export Citation:
Assignee:
ROBERT BOSCH GMBH
International Classes:
G01R31/28; G01M99/00; G01R31/00; G05B23/02; G06F11/22; (IPC1-7): G01R31/28; G01R31/00; G05B23/02; G06F11/22
Attorney, Agent or Firm:
Toshio Yano (3 outside)