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Title:
ALGORITHM FOR OPTIMAL USAGE OF EXTERNAL MEMORY TUNING SEQUENCE
Document Type and Number:
Japanese Patent JP2018125040
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a method, an apparatus and a computer program product for optimally tuning a memory card in a host device.SOLUTION: The apparatus determines at least one tuning parameter associated with the memory card, initiates a reading operation with the memory card, and sends a tuning command to the memory card on the basis of the at least one tuning parameter. The at least one tuning parameter includes a temperature of the memory card, a time elapsed since a last tuning sequence was performed, the number of data blocks sent from the memory card to the host device, and/or the number of transactions between the memory card and the host device. The apparatus also reads data from the memory card, detects a cyclic redundancy check (CRC) error associated with the read data, and sends the tuning command to the memory card upon detecting the CRC error.SELECTED DRAWING: Figure 2

Inventors:
NIR STRAUSS
RACHELIANGEL MANOR
Application Number:
JP2018089246A
Publication Date:
August 09, 2018
Filing Date:
May 07, 2018
Export Citation:
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Assignee:
QUALCOMM INC
International Classes:
G06F3/06; G06F3/08; G06F12/00; G06K7/00
Attorney, Agent or Firm:
Yasuhiko Murayama
Kuroda Shinpei