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Title:
AMORPHOUS SILICON THIN-FILM TRANSISTOR
Document Type and Number:
Japanese Patent JPH01155663
Kind Code:
A
Abstract:

PURPOSE: To reduce the volume of a photocurrent because of the thin film thickness of an amorphous Si film by a method wherein an a-Si film is formed with a protrusion built therein so that a region thereof to be exposed to a light beam coming out of a substrate rear side may be formed thin.

CONSTITUTION: An a-Si layer 4 is formed, provided with a protrusion. That is, Cr is deposited by spattering on a glass substrate 1 for the formation of a gate electrode 2. Next, an SiN film 3 is formed by plasma CVD, and then a non-dope a-Si layer 4 is formed, in that order, in contact with each other. The a-Si layer 4 is subjected to photoetching or the like whereby the region for a channel upper section is formed thick, and the region for source.drain electrodes thin. This design, with the region of the a-Si layer 4 to be exposed to a light beam coming out of the substrate rear surface being formed thin, a photocurrent may be reduced in volume.


Inventors:
MATSUMARU HARUO
TSUTSUI KEN
TANAKA YASUO
KANEKO YOSHIYUKI
Application Number:
JP31402287A
Publication Date:
June 19, 1989
Filing Date:
December 14, 1987
Export Citation:
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Assignee:
HITACHI LTD
International Classes:
H01L27/12; H01L29/78; H01L29/786; (IPC1-7): H01L27/12; H01L29/78
Domestic Patent References:
JPS59163868A1984-09-14
JPS6439065A1989-02-09
Attorney, Agent or Firm:
Akita Haruki



 
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