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Patent Searching and Data


Title:
APPARATUS AND METHOD FOR MEASURING WINDOW FACE DISTORTION
Document Type and Number:
Japanese Patent JP2001343220
Kind Code:
A
Abstract:

To obtain an apparatus and a method for measuring a window face distortion in order for measuring and correcting a wavefront aberration because of the distortion generated by a pressure of a flight wind or a temperature difference to the window face set to an aircraft optical antenna or the like.

There are provided modulating means 2 for modulating a light intensity of light generated from each of light sources 1, a small aperture part 3 for emitting the light from spatially different positions, an optical system 4 for irradiating the light to the window face 11 to be measured, a condenser lens 5 for collecting the light affected by the distortion of the window face 11, detecting means 6a and 6b for detecting a light intensity of the collected light, demodulating means 7a and 7b for demodulating detected light intensity signals, a signal-operating means 8 for calculating a wavefront inclination and the wavefront aberration generated by the distortion of the window face 11 with the use of demodulation signals, a light propagation direction variable means 9 for changing an advance direction of the light, and a control means 10 for controlling the light propagation direction variable means 9 on the basis of the operated result by the signal-operating means 8.


Inventors:
ANDO TOSHIYUKI
SUZUKI HIROSHI
Application Number:
JP2000165950A
Publication Date:
December 14, 2001
Filing Date:
June 02, 2000
Export Citation:
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Assignee:
MITSUBISHI ELECTRIC CORP
International Classes:
G01B11/24; G01S7/48; G02B7/28; (IPC1-7): G01B11/24; G01S7/48; G02B7/28
Attorney, Agent or Firm:
Soga Doteru (6 people outside)