Ｘ線計測装置の校正方法

Japanese Patent JP7257924

B2

A calibration method of an X-ray measuring device includes: a front-stage feature position calculation step of parallelly moving spheres disposed in N places a plurality of times, and identifying centroid positions ImPos(1 to Q)_Dis(1 to M)_Sphr_(1 to N) of projected images of the spheres in the N places; an individual matrix calculation step of calculating an individual projection matrix PPj (j=1 to Q) for each of the spheres; an individual position calculation step of calculating moving positions Xb of the spheres on the basis of the individual projection matrix PPj (j=1 to Q); a coordinate integration step of calculating specific relative position intervals X(1 to N) of the spheres; a rear-stage feature position calculation step; a transformation matrix calculation step of calculating a projective transformation matrix Hk (k=1 to Q); a rotation detection step; a position calculation step; and a center position calculation step.

JPH04105010	METHOD AND DEVICE FOR SHAPE AND DIMENSION MEASUREMENT
JPH06105027	[Title of the Invention] A method for detecting an angle at the time of joining a shield underground
JP2022105453	THREE-DIMENSIONAL GIRDER DISPLACEMENT SENSOR MODULE FOR BRIDGE, THREE-DIMENSIONAL GIRDER DISPLACEMENT DETECTION SYSTEM FOR BRIDGE, AND THREE-DIMENSIONAL GIRDER DISPLACEMENT DETECTION METHOD FOR BRIDGE

Masato now
Hirotake Shinya
Seiji Sasaki
Miyata Jouta

JP2019163979A

April 14, 2023

September 09, 2019

Click for automatic bibliography generation  

Mitutoyo Corporation

G01B15/00; G01N23/046

JP2007078469A
JP2006003200A
JP2007333596A
JP2005127881A
JP2012233919A
JP2016538552A
JP2015525665A

Patent Attorney Corporation MTS International Patent Office

Previous Patent: Columnar conductor and conductor structure

Next Patent: ZIRCONIA MINUTE PARTICLE