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Title:
GAS ANALYZER USING FTIR METHOD AND PROGRAM USED THEREFOR
Document Type and Number:
Japanese Patent JP2010151624
Kind Code:
A
Abstract:

To automatically detect the state that an obtained concentration indicates a preset improper value, and recalculate the concentration by using a spectrum compensation in order to enable various sample gases to be precisely measured at any time.

A gas analyzer 100 using an FTIR method is provided, which includes: a concentration calculating section 21 for calculating the concentration of a measurement component contained in a sample gas from an absorption spectrum obtained by irradiating the sample gas with infrared light; a concentration determining section 22 for determining whether or not the concentration obtained by the concentration calculating section 21 is less than a prescribed value; and a compensating section 24 which compensates a baseline by using absorption spectrum data obtained at a timing when the concentration determining section determines that the concentration is less than the prescribed value, thereby compensating the concentration.

COPYRIGHT: (C)2010,JPO&INPIT


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Inventors:
ITAYA TAKAHIRO
MORI NOBUHISA
Application Number:
JP2008330241A
Publication Date:
July 08, 2010
Filing Date:
December 25, 2008
Export Citation:
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Assignee:
TOYOTA MOTOR CORP
HORIBA LTD
International Classes:
G01N21/27; G01J3/02; G01J3/45; G01N21/35; G01N21/3504
Domestic Patent References:
JPH04262239A1992-09-17
JPH09329559A1997-12-22
JP2008539417A2008-11-13
JPH07507632A1995-08-24
JPS63212826A1988-09-05
JPH10148613A1998-06-02
JP2000065739A2000-03-03
JPH0765932B21995-07-19
JP2741376B21998-04-15
JP2649667B21997-09-03
JPS6348442A1988-03-01
JP2003014626A2003-01-15
JP2000346801A2000-12-15
JPH09510550A1997-10-21
Attorney, Agent or Firm:
Ryuhei Nishimura
Akiko Sato
Saito Shindai



 
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