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Title:
IMAGE DISPLAY DEVICE FOR ANALYZER, AND SURFACE ANALYZING APPARATUS USING THE SAME
Document Type and Number:
Japanese Patent JP2010054420
Kind Code:
A
Abstract:

To enable an uneven shape corresponding to an interest region extracted from two-dimensional distribution of another physical quantity to easily and correctly be understood in a two-dimensional distribution image of a height of predetermined range obtained with an SPM (scanning probe microscope).

An interest region is extracted by determining a threshold of data values forming an object image (two-dimensional or three-dimensional) from which the interest region is extracted (S5). The position information corresponding to the extracted interest region is acquired (S6), the display of a range corresponding to the position information is maintained as it is on an observation image (two-dimensional distribution image of height) and luminance of display outside the range is reduced to highlight and display the range of interest region (S7). In this way, color information of an original observation image is maintained as it is, differently from the case where two images are superimposed, and the uneven shape is displayed by optimal coloring.


Inventors:
YAMAZAKI KENJI
Application Number:
JP2008221182A
Publication Date:
March 11, 2010
Filing Date:
August 29, 2008
Export Citation:
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Assignee:
SHIMADZU CORP
International Classes:
G01Q30/04; G01N23/223; G01N23/225
Domestic Patent References:
JPH0773840A1995-03-17
JPH0862229A1996-03-08
JPH10506457A1998-06-23
JP2002183713A2002-06-28
JP2005164544A2005-06-23
JP2005331306A2005-12-02
JP2006073604A2006-03-16
JP2006105684A2006-04-20
JP2007147365A2007-06-14
JP2009525466A2009-07-09
JPH11110532A1999-04-23
JP2006038541A2006-02-09
JPH0773840A1995-03-17
JPH0862229A1996-03-08
JPH10506457A1998-06-23
JP2002183713A2002-06-28
JP2005164544A2005-06-23
JP2005331306A2005-12-02
JP2006073604A2006-03-16
JP2006105684A2006-04-20
JP2007147365A2007-06-14
JP2009525466A2009-07-09
Attorney, Agent or Firm:
Ryouhei Kobayashi