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Patent Searching and Data


Title:
IMMUNITY TESTER
Document Type and Number:
Japanese Patent JPH08271564
Kind Code:
A
Abstract:

PURPOSE: To obtain an immunity tester for testing the noise resistance of an electronic apparatus by applying noise having arbitrary voltage waveform thereto in which noise having voltage waveform continuous in time, discontinuous in time or the mixture thereof can be generated easily.

CONSTITUTION: Outputs from a plurality of arbitrary voltage waveform generators 1a, 1b generating arbitrary continuous voltage waveform are turned ON/OFF arbitrarily by means of a plurality of switches 2a, 2b. Two arbitrary voltage waveforms are then superposed to produce a combined arbitrary voltage waveform which is applied to an apparatus as radiation noise from an antenna 10, conduction noise from a connector or induction noise from a clamp. When the arbitrary voltage waveform, ON/OFF control set conditions, etc., are stored in a memory 6, noise output conditions can be reproduced without setting them again.


Inventors:
UCHIDA TAKESHI
MIYAZAKI CHIHARU
OKA NAOHITO
TOMIYAMA KATSUMI
Application Number:
JP7164895A
Publication Date:
October 18, 1996
Filing Date:
March 29, 1995
Export Citation:
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Assignee:
MITSUBISHI ELECTRIC CORP
International Classes:
G01R29/08; G01R31/00; H03B29/00; (IPC1-7): G01R31/00; G01R29/08; H03B29/00
Attorney, Agent or Firm:
葛野 信一