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Title:
IMPROVED CLEANING OF PLASMA CHAMBER WALLS BY ADDING OF NOBLE GAS CLEANING STEP
Document Type and Number:
Japanese Patent JP2009065170
Kind Code:
A
Abstract:

To provide an improved reaction chamber cleaning process which is readily applicable, may be combined with standard cleaning procedure, and is able to remove water residues by making use of noble-gas plasma reactions.

A noble-gas plasma (e.g. He) that emits high-energy EUV photons (E20 eV) which is able to destruct water molecules forming electronically excited oxygen atoms is used to remove the adsorbed water. The method includes emitting extreme-ultraviolet and/or vacuum-ultraviolet photons, having energy sufficiently high to initiate photodegradation of water molecules absorbed in a material, exposing the surface to the noble-gas plasma capable of emitting radicals of oxygen, hydrogen, and/or hydroxyl groups, and removing the radicals from the reaction chamber.


Inventors:
URBANOWICZ ADAM MICHAL
BAKLANOV MIKHAIL
SHAMIRYAN DENIS
DE GENDT STEFAN
Application Number:
JP2008229936A
Publication Date:
March 26, 2009
Filing Date:
September 08, 2008
Export Citation:
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Assignee:
IMEC INTER UNI MICRO ELECTR
UNIV LEUVEN KATH
International Classes:
H01L21/3065; H01L21/304
Domestic Patent References:
JPH11286023A1999-10-19
JP2002228356A2002-08-14
JPH11336662A1999-12-07
JP2006508535A2006-03-09
JPH1098019A1998-04-14
JP2001351867A2001-12-21
JP2007101024A2007-04-19
JP2009065125A2009-03-26
Foreign References:
US20050133059A12005-06-23
WO2006015072A22006-02-09
US20020074014A12002-06-20
Attorney, Agent or Firm:
Takuji Yamada
Mitsuo Tanaka