To provide an improved reaction chamber cleaning process which is readily applicable, may be combined with standard cleaning procedure, and is able to remove water residues by making use of noble-gas plasma reactions.
A noble-gas plasma (e.g. He) that emits high-energy EUV photons (E20 eV) which is able to destruct water molecules forming electronically excited oxygen atoms is used to remove the adsorbed water. The method includes emitting extreme-ultraviolet and/or vacuum-ultraviolet photons, having energy sufficiently high to initiate photodegradation of water molecules absorbed in a material, exposing the surface to the noble-gas plasma capable of emitting radicals of oxygen, hydrogen, and/or hydroxyl groups, and removing the radicals from the reaction chamber.
BAKLANOV MIKHAIL
SHAMIRYAN DENIS
DE GENDT STEFAN
UNIV LEUVEN KATH
JPH11286023A | 1999-10-19 | |||
JP2002228356A | 2002-08-14 | |||
JPH11336662A | 1999-12-07 | |||
JP2006508535A | 2006-03-09 | |||
JPH1098019A | 1998-04-14 | |||
JP2001351867A | 2001-12-21 | |||
JP2007101024A | 2007-04-19 | |||
JP2009065125A | 2009-03-26 |
US20050133059A1 | 2005-06-23 | |||
WO2006015072A2 | 2006-02-09 | |||
US20020074014A1 | 2002-06-20 |
Mitsuo Tanaka
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