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Title:
MEASURING METHOD AND MEASURING INSTRUMENT USING TOTAL REFLECTION ATTENUATION
Document Type and Number:
Japanese Patent JP2006098369
Kind Code:
A
Abstract:

To easily and precisely measure a state of total reflection attenuation by a small and inexpensive instrument.

Air is introduced into a measuring flow passage 76 before actual measurement, a p-polarized light beam 30 is made incident into an interface 12a, a light intensity distribution of the p-polarized light beam 30 total-reflected on the interface 12a is detected by a photodetector 40 of a photodiode array, and a reference light intensity distribution, that is a light intensity distribution of the p-polarized light beam 30 itself, is acquired to be stored in a measuring means 61. A sample of a measuring object is introduced thereafter into the measuring flow passage 76 to measure a light intensity distribution of the p-polarized light beam 30 total-reflected on the interface 12a. an influence of dispersion in the light intensity distribution of the light beam is offset by division with the reference light intensity distribution a distribution value by a distribution value, in the measuring means 61, to detect precisely a position of a total reflection attenuation angle θSP. The light beam comprising a p-polarized wave is usable, and a separation means for separating the light beam total-reflected on the interface 12a into the p-polarized wave and an s-polarized wave is not required to be provided.


Inventors:
SATO SHU
KIMURA TOSHIHITO
OTSUKA TAKASHI
Application Number:
JP2004288105A
Publication Date:
April 13, 2006
Filing Date:
September 30, 2004
Export Citation:
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Assignee:
FUJI PHOTO FILM CO LTD
International Classes:
G01N21/27; G01N21/41
Attorney, Agent or Firm:
Yanagita Seiji
Go Sakuma