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Title:
METHOD AND APPARATUS FOR MEASURING PROFILE OF THREE-DIMENSIONAL CURVED SURFACE
Document Type and Number:
Japanese Patent JP3013690
Kind Code:
B2
Abstract:

PURPOSE: To measure THE PROFILE OF a three-dimensional curved surface in a short time by picking up the state where the reflected pattern of a plurality of slit lights is shifted on the surface of an object by means of a television camera and synthesizing an image where one rotational scanning angle at a moment of passing the slit light constitutes a pixel value for every position on the surface of the object corresponding to each pixel.
CONSTITUTION: An object 2 is mounted on a reference plane 1 and a slit luminous flux from a plurality of slit light sources 3 is reflected on a rotary mirror 4 in order to scan the object 2. A profile measuring apparatus 9 drives a motor 9 to turn the mirror 4 and the rotational angle thereof is detected by means of a rotational angle sensor 7 thus inputting the scanning angle &phiv of the slit light 3a every moment to the measuring apparatus 9. An image synthesizing circuit 10 processes the video signal on the surface of the object 2 inputted from a TV camera 8 and reads in one rotational scanning angle &phiv at the moment when a plurality of slit lights 3a pass through an image for each image within a screen. That value is employed as a pixel for synthesizing an image 13 and then the profile of height is operated 14 and stored in a three- dimensional memory.


Inventors:
Harayama, Masami
Kawakami, Masaaki
Kawamura, Tsutomu
Application Number:
JP1994000053674
Publication Date:
February 28, 2000
Filing Date:
March 24, 1994
Export Citation:
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Assignee:
NKK CORP
International Classes:
G01B11/24; G06T1/00; G06T7/00; (IPC1-7): G01B11/24; G06T7/00
Attorney, Agent or Firm:
佐々木 宗治 (外3名)