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Title:
METHOD OF INSPECTING AND MANUFACTURING ELECTROOPTICAL DEVICE
Document Type and Number:
Japanese Patent JP2009237025
Kind Code:
A
Abstract:

To easily and surely detect display defects of a liquid crystal device with, for example, operator's visual observation.

An inspection image (PB) is composed of inspection patterns (Pb1), (Pb2), and (Pb3) displayed simultaneously on pixel rows (g1-2), (g2-3), and (g3-4) respectively. Each data line corresponding to the pixel rows (g1-2), (g2-3), and (g3-4) respectively is electrically connected to pixel signal line different from each other. Thus, each of the inspection patterns (Pb1), (Pb2), and (Pb3) is electrically connected to an image signal line supplying mutually different image signal out of a plurality of image signals obtained by serial-to-parallel conversion of image signals. That is, the pitch of inspection patterns simultaneously displayed is different from the pitch of the data lines to which the same image signal is supplied when driving a liquid crystal device.


Inventors:
YAMADA TADASHI
Application Number:
JP2008079960A
Publication Date:
October 15, 2009
Filing Date:
March 26, 2008
Export Citation:
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Assignee:
SEIKO EPSON CORP
International Classes:
G09G3/36; G02F1/13; G02F1/133; G09F9/00; G09G3/20
Attorney, Agent or Firm:
Masahiko Ueyanagi
Osamu Suzawa
Kazuhiko Miyasaka



 
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