METHOD FOR MEASURING DEPTH OF GAP OF MAGNETIC HEAD

Japanese Patent JPS63106504

A

PURPOSE:To calculate the depth of a gap while reducing the irregularity of an output characteristic, by a method wherein the width of the gap is measured and a place where the width of the gap exceeds a preset quantitative value is set to the end of the gap and the distance up to the end of the gap is measured from the surface of a track. CONSTITUTION:The gap 2 and winding window 3 of a core 13 is magnified by a magnifying optical system 14 and the image obtained from an image pickup device 15 is binarized by a confirmation control unit 16 to be projected on monitor TV 17 to obtain a binary image. The core 13 is shown in such a state that an oblique line part 18 is dark and the other part is bright. This measuring procedure is performed in such way that the address 20 of a track surface 1 is calculated from the binary image and the width 21 of a gap is measured in the direction of winding 3 to calculate an address 23 wherein the width 21 of the gap exceeds the quantitative value 22 of the max. limit value of the width of the gap set on the basis of the common difference in the formation of the width of the gap and the depth of the gap is calculated from formula. Herein, pixel resolving power is calculated by dividing the dimension of a pixel by the magnification of the magnifying optical system.

JP6488301	Differential method and equipment for measuring semiconductor targets
JPH0697042	BEAM SPLITTER
JP3837357	ELECTRONIC PEN DATA INPUT DEVICE FOR COMPUTER, AND COORDINATE MEASURING METHOD

KANEJIMA KEINOSUKE
MAKINO MASASHI

JP25221086A

May 11, 1988

October 23, 1986

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MATSUSHITA ELECTRIC IND CO LTD

G01B11/02; G11B5/455; (IPC1-7): G01B11/02; G11B5/455

Toshio Nakao

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