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Patent Searching and Data


Title:
MICROSCOPE CONTROL DEVICE AND OPTICAL DISTORTION CORRECTION METHOD
Document Type and Number:
Japanese Patent JP2012042669
Kind Code:
A
Abstract:

To provide a microscope control device that can suppress a computation load required for distortion correction processing in a defocus detection processing using a phase-difference optical system, and an optical distortion correction method thereof.

The microscope control device includes an offset processing unit for correcting phase-difference information on a phase-difference between phase-difference images that is generated based on a pair of phase-difference images obtained by imaging a sample by the microscope based on offset information of a phase-difference due to an optical distortion intrinsic to the microscope, and a defocus amount calculation unit for calculating the defocus amount of the sample based on the offset-corrected phase-difference information.


Inventors:
YAMAMOTO TAKASHI
Application Number:
JP2010183152A
Publication Date:
March 01, 2012
Filing Date:
August 18, 2010
Export Citation:
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Assignee:
SONY CORP
International Classes:
G02B21/00; G02B7/28; G02B7/34; G02B21/36; G06T3/00
Attorney, Agent or Firm:
Miaki Kametani
Tetsuo Kanamoto
Koji Hagiwara
Kazuki Matsumoto