Title:
OPERATING VOLTAGE RETRIEVAL PROGRAM, OPERATING VOLTAGE RETRIEVAL DEVICE, AND OPERATING VOLTAGE RETRIEVAL METHOD
Document Type and Number:
Japanese Patent JP2017027637
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To efficiently acquire an operation lower limit voltage of a semiconductor storage device when an operating voltage and a word line voltage of the semiconductor storage device are adjusted according to manufacturing variations.SOLUTION: A computer acquires a yield of the semiconductor storage device based on circuit information, characteristics variation information, an operating voltage, and a word line voltage of the semiconductor storage device (step 1001). When a word line voltage is present in which the yield satisfies a predetermined condition, the computer determines an operating voltage range smaller than the operating voltage as retrieval range (step 1002). In contrast, when a word line voltage is not present in which the yield satisfies the predetermined condition, the computer determines an operating voltage range larger than the operating voltage as retrieval range. The computer further retrieves an operation lower limit voltage in the determined retrieval range (step 1003), and outputs the retrieved operation lower limit voltage (step 1004).SELECTED DRAWING: Figure 10
Inventors:
MATSUO TATSU
Application Number:
JP2015141637A
Publication Date:
February 02, 2017
Filing Date:
July 15, 2015
Export Citation:
Assignee:
FUJITSU LTD
International Classes:
G11C29/56; G06F17/50; G11C11/41
Attorney, Agent or Firm:
Yoshiyuki Osuga
virtue Tamio Ei
virtue Tamio Ei