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Patent Searching and Data


Title:
OPTICAL SYSTEM FOR PARTICLE ANALYSIS
Document Type and Number:
Japanese Patent JPS6151542
Kind Code:
A
Abstract:

PURPOSE: To realize high-precision photometry by providing a light shield body at a position conjugate to the edge of a distribution part about a condenser lens, and removing its scattered light and preventing the mixture of unnecessary information.

CONSTITUTION: Light shield bodies 7aW7d are installed at positions conjugate to edges 2aW2d of the distribution part 2 with respect to the condenser lens 4. Then, irradiation light converged on an object body S through the lens 2 is scattered by the object body S and then converged on a photoelectric detector 6 through a condenser lens 4, but scattered light from the edges 2aW2d is cut off by the light shield bodies 7aW7d, and further scattered light from the periphery of the distribution part 2 is removed by an aperture 5, so that the photoelectric detector 6 photodetects only scattered light from the object body S. Consequently, high-precision photometry is performed.


Inventors:
ITO YUJI
Application Number:
JP17450484A
Publication Date:
March 14, 1986
Filing Date:
August 22, 1984
Export Citation:
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Assignee:
CANON KK
International Classes:
G01N15/14; G01N21/47; G01N21/49; G01N21/53; (IPC1-7): G01N15/14; G01N21/49
Attorney, Agent or Firm:
Hibiya Masahiko